The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2021
Filed:
Sep. 19, 2017
Murata Manufacturing Co., Ltd., Nagaokakyo, JP;
Yuki Matsuno, Nagaokakyo, JP;
Teruhisa Tsuru, Nagaokakyo, JP;
MURATA MANUFACTURING CO., LTD., Nagaokakyo, JP;
Abstract
A product inspection device and method for correctly calculating consumer and producer risks irrespective of the type of distribution of products. A characteristic value representing a predetermined product characteristic is measured for each product as a product measurement value, and a standard deviation of measurement variations in measurement results is calculated as a measurement value standard deviation. The products are determined to be conforming based on whether the measured product measurement value falls within a range of a product standard. Consumer and producer risks are calculated based on the measurement variations. The calculated consumer and producer risks are respectively and successively added up and it is determined whether the number of products having undergone the adding have reached a predetermined number. If so, the added up consumer risk and producer risk are divided by the number of products to calculate a final consumer risk and a final producer risk.