The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2021
Filed:
Feb. 02, 2017
Applicant:
Fujikura Ltd., Tokyo, JP;
Inventors:
Toshio Mouri, Sakura, JP;
Masahiro Kashiwagi, Sakura, JP;
Assignee:
FUJIKURA LTD., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/32 (2006.01); G02B 3/00 (2006.01); G02B 6/26 (2006.01); G02B 6/255 (2006.01);
U.S. Cl.
CPC ...
G02B 6/32 (2013.01); G02B 3/0087 (2013.01); G02B 6/262 (2013.01); G02B 6/2551 (2013.01);
Abstract
An optical devicehas a GRIN lens, a preceding-stage optical fiberfrom which a light beam is entered to the GRIN lens, and a subsequent-stage optical fiberto which a light beam emitted from the GRIN lensis entered. A method for adjusting beam quality includes a measurement process Pin which a light beam is entered to the preceding-stage optical fiberand the beam quality of a light beam to be emitted from the subsequent-stage optical fiberthrough the GRIN lensis measured, and an adjustment process Pin which the length of the GRIN lensis adjusted on the basis of a result in the measurement process P