The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2021
Filed:
Jan. 25, 2018
Applicant:
SK Hynix Inc., Gyeonggi-do, KR;
Inventors:
Seong Jin Kim, Gyeonggi-do, KR;
Dae Ho Yun, Gyeonggi-do, KR;
Assignee:
SK hynix Inc., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3185 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2879 (2013.01); G01R 31/2831 (2013.01); G01R 31/2856 (2013.01); G01R 31/318511 (2013.01); H01L 22/34 (2013.01); H01L 22/32 (2013.01);
Abstract
A semiconductor device including a test circuit is disclosed. The semiconductor device includes a test pad coupled to a probe of a test device during a wafer test; a normal pad configured to receive a power or a signal during a normal mode; and a test circuit configured to perform a predetermined test operation based on a test signal received through the test pad. The test circuit is disposed below the normal pad.