The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Feb. 20, 2019
Applicants:

Real Intent, Inc., Sunnyvale, CA (US);

Vishnu Vimjam, Sunnyvale, CA (US);

Inventors:

Vishnu Vimjam, San Jose, CA (US);

Vikas Sachdeva, Bengaluru, IN;

Prakash Narain, San Carlos, CA (US);

Paul Vyedin, San Jose, CA (US);

Assignee:

Real Intent, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/317 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2846 (2013.01); G01R 31/317 (2013.01); G06F 11/07 (2013.01);
Abstract

Methods and systems are described to identify potential failures caused by metastability arising from signal propagation between asynchronous clock domains in integrated circuits with multiple operating modes, each mode allowing selected clocks to propagate. Typical integrated circuits have numerous operating modes, and hence numerous possible clock combinations, each combination causing different asynchronous clock-domain crossings, and hence different potential failures. Since verification for even one clock combination is time-consuming, explicitly enumerating and verifying all possible clock combinations is unviable. In practice very few clock combinations are verified, possibly missing failures. The present invention achieves superior performance, scalability, comprehensiveness and precision in verification despite numerous operating modes, due the following insights: (a) The number of possible clock combinations for a transmit-receive signal pair is small relative to the total number of operating modes, and (b) Cause of failure for a transmit-receive pair remain identical across many clock combinations associated with it.


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