The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Mar. 28, 2017
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Wafa Ben Hassen, Paris, FR;

Julien Mottin, Grenoble, FR;

Antoine Dupret, Orsay, FR;

Miguel Gallego Roman, Paris, FR;

Suzanne Lesecq, Froges, FR;

Diego Puschini Pascual, Grenoble, FR;

Nicolas Ravot, Chelles, FR;

Armando Zanchetta, Bons-Enchablais, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2020.01); G01R 31/11 (2006.01); G01R 1/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/088 (2013.01); G01R 31/11 (2013.01);
Abstract

A method for detecting soft faults in a transmission line includes the following steps: acquiring a measurement, called time-domain reflectogram, of a signal characteristic of the reflection of a reference signal previously injected into the line, determining the difference between the time-domain reflectogram and a time-domain reflectogram measured previously for the same line or an identical line of similar characteristics, in order to obtain a corrected time-domain reflectogram, applying a plurality of independent transformations to the corrected time-domain reflectogram in order to obtain a plurality of independent transformed reflectograms, converting the transformed reflectograms into a plurality of mutually independent probabilities of occurrence of a fault, applying a data merging method to the probabilities of occurrence of a fault to deduce therefrom a unified value of the probability of occurrence of a fault.


Find Patent Forward Citations

Loading…