The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Jul. 22, 2019
Applicant:

Northrop Grumman Systems Corporation, Falls Church, VA (US);

Inventors:

Kenneth F. McKinney, San Diego, CA (US);

Kenneth R. Weidele, San Diego, CA (US);

Geoffrey R. Janjua, Rolling Hills Estates, CA (US);

Allan T. Hilchie, Sierra Vista, AZ (US);

Kirk L. Haderlie, San Diego, CA (US);

Assignee:

NORTHROP GRUMMAN SYSTEMS CORPORATION, Falls Church, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 23/16 (2006.01);
U.S. Cl.
CPC ...
G01R 31/002 (2013.01); G01R 23/16 (2013.01); G01R 31/008 (2013.01);
Abstract

A system and related method for determining whether an electrical circuit has been compromised. The system includes a circuit probe positioned relative to the electrical circuit that detects electromagnetic circuit emissions therefrom and an analysis device electrically coupled to the circuit probe and receiving electromagnetic emissions detection signals therefrom, where the analysis device identifies constituent frequencies and their magnitudes in the detection signals. The system also includes a comparison processor responsive to the constituent frequencies and magnitudes from the analysis device, where the comparison processor compares the constituent frequencies and magnitudes to previously stored constituent frequencies and magnitudes obtained from an equivalent test circuit to the electrical circuit to determine whether the electrical circuit has been compromised. A background probe can be provided to obtain background emissions that can be subtracted from the circuit emissions.


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