The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Jun. 28, 2016
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Manabu Ueda, Kyoto, JP;

Jun Watanabe, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01); G01N 30/72 (2006.01); G01N 30/88 (2006.01); G01N 30/62 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8631 (2013.01); G01N 30/72 (2013.01); G01N 30/86 (2013.01); G01N 30/8641 (2013.01); G01N 30/8679 (2013.01); G01N 30/7206 (2013.01); G01N 30/7233 (2013.01); G01N 2030/625 (2013.01); G01N 2030/8872 (2013.01);
Abstract

The detection of minute amounts of components that have been undetectable due to an influence of a mobile phase or reagents or the like added to the mobile phase is realized in LC-MS. At the outset, blank measurement is executed, and an m/z value Mof a background signal derived from a mobile phase or the like is extracted on a mass spectrum obtained by the blank measurement (S-S). An analysis method is then created that executes scanning measurement in a plurality of divided m/z ranges in which the m/z value Mof the background signal has been excluded from a predetermined m/z range. An LC/MS analysis of the target sample is executed according to the analysis method (S-S). When a total ion chromatogram (TIC) is created from data obtained by the LC/MS analysis, influence of the background signal hardly appears in the TIC, and the base line is lowered.


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