The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Sep. 29, 2015
Applicant:

BD Kiestra B.v., Drachten, NL;

Inventors:

Brian Reuben Langhoff, Julian, NC (US);

William Alan Fox, Lake Wylie, SC (US);

Kerry Lynn Smith, York, PA (US);

Assignee:

BD KIESTRA B.V., Drachten, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/51 (2006.01); G01N 21/03 (2006.01); G01N 21/25 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/51 (2013.01); G01N 21/03 (2013.01); G01N 21/253 (2013.01); G01N 2021/0357 (2013.01); G01N 2021/0385 (2013.01); G01N 2021/4726 (2013.01); G01N 2021/513 (2013.01);
Abstract

A nephelometer that measures turbidity of low volume suspensions using measurements of light transmitted through and/or scattered by the sample. The sample suspension is placed in a tiered cuvette adapted to facilitate measuring the turbidity of low volume samples. The lower portion of the cuvette has smaller dimensions, in horizontal cross section, than the top portion. Both lower and upper portions have angled surfaces. The lower, smaller portion of the cuvette is interrogated by the nephelometer.


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