The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Aug. 15, 2019
Applicants:

Robert Bosch Gmbh, Stuttgart, DE;

Trumpf Photonic Components Gmbh, Ulm, DE;

Inventors:

Alexander Van Der Lee, Venlo, NL;

Robert Weiss, Waldbronn, DE;

Sören Sofke, Tübingen, DE;

Hans Spruit, Waalre, NL;

Jens-Alrik Adrian, Pfullingen, DE;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 15/02 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1459 (2013.01); G01N 15/0211 (2013.01); G01N 15/1434 (2013.01); G01N 2015/03 (2013.01);
Abstract

An optical particle sensor device comprises an optical emitter device for emitting a multitude of measurement laser beams; a detector device for detecting the measurement laser beams scattered on particles in the vicinity of the optical particle sensor device and for generating a single measuring signal assigned to this for each measurement laser beam; and an evaluation device for determining at least one estimated particle value for the number of particles per volume using at least one single measurement signal, wherein the evaluation device determines at least two estimated particle values for the number of particles per volume, which are based on at least partially different single measurement signals and/or a different number of single measurement signals, and on the basis of at least part of the estimated particle values, determines at least one output value for the particle load.


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