The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Dec. 29, 2018
Applicant:

Omnitek Partners Llc, Ronkonkoma, NY (US);

Inventors:

Jahangir S Rastegar, Stony Brook, NY (US);

Jacques Fischer, Sound Beach, NY (US);

Dake Feng, Kings Park, NY (US);

Assignee:

OMNITEK PARTNERS LLC, Ronkonkoma, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 7/08 (2006.01); G01N 3/307 (2006.01); G01N 3/31 (2006.01);
U.S. Cl.
CPC ...
G01M 7/08 (2013.01); G01N 3/307 (2013.01); G01N 3/31 (2013.01);
Abstract

A shock testing machine including: a test platform for holding one or more objects to be shock tested, the test platform having an impact surface; a fixed member having a surface disposed a predetermined distance from a corresponding surface of the test platform, the test platform being movable such that the surface of the test platform can contact the corresponding surface of the fixed member upon an impact to the impact surface; and a flywheel having one or more cams for contacting the impact surface upon rotation of the flywheel such that the impact of each of the one or more cams on the impact surface causes the surface of the test platform to impact the corresponding surface of the fixed member to produce a shock in the one or more objects to be tested.


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