The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2021
Filed:
Nov. 14, 2016
Renishaw Plc, Wotton-under-Edge, GB;
Nicholas Henry Hannaford Jones, Stroud, GB;
Ceri Brown, Redland, GB;
Ramkumar Revanur, Stafford, GB;
Geoffrey McFarland, Wickwar, GB;
RENISHAW PLC, Wotton-under-Edge, GB;
Abstract
A method of monitoring an additive manufacturing apparatus. The method includes receiving one or more sensor signals from the additive manufacturing apparatus during a build of a workpiece, comparing the one or more sensor signals to a corresponding acceptable process variation of a plurality of acceptable process variations and generating a log based upon the comparisons. Each acceptable process variation of the plurality of acceptable process variations is associated with at least one state of progression of the build of the workpiece and the corresponding acceptable process variation is the acceptable process variation associated with the state of progression of the build when the one or more sensor signals are generated.