The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Dec. 03, 2015
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Takuya Nishimura, Tokyo, JP;

Kota Aizawa, Tokyo, JP;

Yoshihiro Wakita, Tokyo, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/0295 (2006.01); A61B 5/026 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0295 (2013.01); A61B 5/004 (2013.01); A61B 5/0037 (2013.01); A61B 5/0066 (2013.01); A61B 5/0077 (2013.01); A61B 5/026 (2013.01); A61B 5/0261 (2013.01);
Abstract

Provided is an optical unit that radiates a coherent light such that the coherent light is incident in a target region of speckle image capturing in accordance with a pattern that includes a bright region and a dark region located uniformly in at least one direction in the target region. Provided is a measurement system including: an optical unit that radiates a coherent light such that the coherent light is incident in a target region in accordance with a pattern that includes a bright region and a dark region located uniformly in at least one direction in the target region; a light reception unit that receives a reflected light of the coherent light in the target region; and an imaging unit that captures an image of a speckle included in the reflected light.


Find Patent Forward Citations

Loading…