The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2021
Filed:
Feb. 28, 2018
Grintech Gmbh, Jena, DE;
Bernhard Messerschmidt, Jena, DE;
Gregor Matz, Jena, DE;
GRINTECH GmbH, Jena, DE;
Abstract
An optical probe () for optically examining an object () is described, said optical probe having a first optical beam path for a scanning imaging method and a second optical beam path for a spectroscopic method. The optical probe comprises a first optical fibre () in the first optical beam path and a scanning apparatus () that is configured to laterally deflect the first optical fibre () or illumination light () emerging from the first optical fibre () for the purposes of scanning the object () during the scanning imaging method. The optical probe comprises a second optical fibre () in the second optical beam path, said second optical fibre being configured to guide excitation light or detected object light for the spectroscopic method, and a beam splitter filter (), wherein the beam path of the scanning imaging method and the beam path of the spectroscopic method are brought into partial overlap in the probe () by means of the beam splitter filter (). The optical probe () has a diameter of no more than 5 mm. Furthermore, a method for operating the optical probe () is specified.