The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Dec. 05, 2018
Applicant:

Kowa Company, Ltd., Aichi, JP;

Inventors:

Satoshi Shimada, Tokyo, JP;

Takuya Hara, Tokyo, JP;

Assignee:

KOWA COMPANY, LTD., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/024 (2006.01);
U.S. Cl.
CPC ...
A61B 3/024 (2013.01); A61B 3/0025 (2013.01); A61B 3/0033 (2013.01); A61B 3/0041 (2013.01); A61B 3/0058 (2013.01);
Abstract

In a perimetry to be conducted, designating an inspection region through a region designator, a perimeter is configured to set a required time of the perimetry (upper limit time) through an upper limit condition setter and to determine total number or positions of stimulus presentation spots based upon the upper limit time. In such a configuration, an examinee knows the time to finish the inspection, and is able to highly keep his (her) concentration in comparison with a case where the required time is not known, thereby improving precision of the inspection.


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