The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Apr. 04, 2019
Applicant:

Analog Devices, Inc., Norwood, MA (US);

Inventors:

Tyler Ray, Hanover, NH (US);

Nicholas J. Jakse, Lyndhurst, OH (US);

Neal Tait Kurfiss, Somerville, MA (US);

Christopher M. Hanna, Arlington, MA (US);

Miguel A. Chavez, Cambridge, MA (US);

Joshua Berlin, Boston, MA (US);

Assignee:

ANALOG DEVICES, INC., Norwood, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04R 29/00 (2006.01); H04R 23/00 (2006.01); G01S 7/48 (2006.01); G01S 17/50 (2006.01);
U.S. Cl.
CPC ...
H04R 29/001 (2013.01); G01S 7/48 (2013.01); G01S 17/50 (2013.01); H04R 23/008 (2013.01);
Abstract

Systems and methods for optically measuring displacement of an element include an emitter for emitting an optical signal, a first detector for detecting reflections of the optical signal from the element, a second detector for detecting reflections of the optical signal from a raised cover structure, a processor for receiving the detected reflections from the first and second detectors and removing distortions in the detected reflections from the first detector using the detected reflections from the second detector.


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