The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2021
Filed:
Mar. 10, 2020
Kohta Aoyagi, Kanagawa, JP;
Susumu Mikajiri, Tokyo, JP;
Kimiharu Yamazaki, Kanagawa, JP;
Satoshi Nakayama, Kanagawa, JP;
Hideyo Makino, Tokyo, JP;
Yoshinari Onuma, Kanagawa, JP;
Kohta Aoyagi, Kanagawa, JP;
Susumu Mikajiri, Tokyo, JP;
Kimiharu Yamazaki, Kanagawa, JP;
Satoshi Nakayama, Kanagawa, JP;
Hideyo Makino, Tokyo, JP;
Yoshinari Onuma, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An image inspection apparatus includes a first outputter that outputs color information of an image to be formed on a recording medium determined according to the type of recording medium; a reader provided facing one side of the recording medium and configured to output an image signal obtained by reading the recording medium; a second outputter that outputs an edge position of the recording medium and/or the image formed on the recording medium detected based on the image signal; first background members configured to face and contact another side of the recording medium and having different heights; second background members configured to face and contact the another side of the recording medium and having different colors; and an arranger that brings one member, selected according to the recording medium type from among the first and second background members, into contact with the another side of the recording medium.