The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Jul. 10, 2020
Applicant:

Agency for Defense Development, Daejeon, KR;

Inventors:

Sang Won Kim, Daejeon, KR;

Dong Keun Lee, Daejeon, KR;

Jeung Min Joo, Daejeon, KR;

Jung Hoon Kim, Daejeon, KR;

Sung Jin Jo, Daejeon, KR;

Un Seob Jeong, Daejeon, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/20 (2006.01); H03M 1/10 (2006.01); H03M 1/12 (2006.01); H03M 1/60 (2006.01); G01R 23/14 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1085 (2013.01); G01R 23/145 (2013.01); H03M 1/1245 (2013.01); H03M 1/60 (2013.01);
Abstract

Provided are an apparatus and a method for measuring a frequency of a broadband signal by using low-speed ADCs having sub-Nyquist sampling rates. A plurality of channels each including a low-speed ADC having a sub-Nyquist sampling rate (e.g. sampling frequency from several MHz to hundreds of MHz) are provided, and the frequency of an input signal corresponding to a combination of frequencies calculated through the respective channels is estimated. Therefore, as the number of channels increases, the range of measurable frequencies may be extended.


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