The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Mar. 16, 2018
Applicant:

Techhold Llc, Minneapolis, MN (US);

Inventors:

Greg Fuchs, River Falls, WI (US);

Wallace Jensen, Centerville, MN (US);

Frederick R. Faxvog, Medina, MN (US);

David Blake Jackson, Excelsior, MN (US);

Gale K. Nordling, Alexandria, MN (US);

Assignee:

TechHold LLC, Minneapolis, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02H 3/08 (2006.01); H02H 3/50 (2006.01); H02H 3/20 (2006.01); H02H 7/04 (2006.01); H02H 5/00 (2006.01);
U.S. Cl.
CPC ...
H02H 7/04 (2013.01); H02H 3/08 (2013.01); H02H 3/20 (2013.01); H02H 3/50 (2013.01); H02H 5/005 (2013.01);
Abstract

A control device for an electrical protection circuit for use in an alternating current system including a transformer is disclosed. An example system includes a first measurement probe, a second measurement probe configured to measure an electrical property within the electrical protection circuit, and a control module, including a processing device. The control module is configured to monitor a measurement from the first measurement probe and transmit a protection activation control signal to the switch assembly based on the measurement from the first measurement probe exceeding a first predetermined threshold. The control module is also configured to monitor a measurement from the second measurement probe and transmit a protection deactivation control signal to the switch assembly based on the measurement from the second measurement probe satisfying a second predetermined threshold.


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