The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Oct. 30, 2017
Applicants:

The Regents of the University of California, Oakland, CA (US);

Subramanian S. Iyer, Los Angeles, CA (US);

Takafumi Fukushima, Los Angeles, CA (US);

Adeel A. Bajwa, Los Angeles, CA (US);

Inventors:

Subramanian S. Iyer, Los Angeles, CA (US);

Takafumi Fukushima, Los Angeles, CA (US);

Adeel A. Bajwa, Los Angeles, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); H01L 21/56 (2006.01); H01L 23/538 (2006.01); H01L 27/12 (2006.01); H01L 23/31 (2006.01);
U.S. Cl.
CPC ...
H01L 23/562 (2013.01); H01L 21/565 (2013.01); H01L 23/5386 (2013.01); H01L 23/5387 (2013.01); H01L 23/5389 (2013.01); H01L 24/09 (2013.01); H01L 24/19 (2013.01); H01L 24/32 (2013.01); H01L 24/97 (2013.01); H01L 27/1218 (2013.01); H01L 21/568 (2013.01); H01L 23/3121 (2013.01); H01L 2224/02379 (2013.01); H01L 2224/16225 (2013.01); H01L 2224/18 (2013.01); H01L 2224/45015 (2013.01); H01L 2224/48091 (2013.01); H01L 2924/00014 (2013.01); H01L 2924/3511 (2013.01);
Abstract

A fan-out wafer level package includes: (1) a flexible substrate; (2) a semiconductor component embedded in the flexible substrate, the semiconductor component including an active surface that is exposed from the flexible substrate, the semiconductor component including a bonding pad adjacent to the active surface; (3) a stress buffer layer disposed over the flexible substrate and the semiconductor component, the stress buffer layer defining an opening exposing the bonding pad of the semiconductor component; and (4) an interconnect disposed over the stress buffer layer and including a portion extending into the opening of the stress buffer layer to electrically connect to the bonding pad of the semiconductor component.


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