The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2021
Filed:
Apr. 02, 2014
Applicant:
Sequenom, Inc., San Diego, CA (US);
Inventors:
Zeljko Dzakula, San Diego, CA (US);
Chen Zhao, San Diego, CA (US);
Cosmin Deciu, San Diego, CA (US);
Assignee:
Sequenom, Inc., San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16B 20/00 (2019.01); G16B 30/00 (2019.01); G16B 40/00 (2019.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G16B 20/00 (2019.02); G06F 17/18 (2013.01); G16B 30/00 (2019.02); G16B 40/00 (2019.02);
Abstract
A method and system for analyzing circulating cell-free nucleic acids from a pregnant female with reduced bias, Counts of sequence reads mapped to portions of a reference genome are obtained. A regression model is generated that models the relationship between the counts and the GC content. The read counts are normalized according to the regression model to remove the GC bias. The normalized counts are used for further analysis, such as the detection of fetal aneuploidy.