The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

May. 04, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Prasenjit Dey, Bangalore, IN;

Vijay Ekambaram, Tamilnadu, IN;

Ravindranath Kokku, Yorktown Heights, NY (US);

Nitendra Rajput, Haryana, IN;

Ruhi Sharma Mittal, Bangalore, IN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G09B 7/02 (2006.01); G06F 17/18 (2006.01); G09B 5/06 (2006.01); G09B 5/08 (2006.01);
U.S. Cl.
CPC ...
G09B 7/02 (2013.01); G06F 17/18 (2013.01); G09B 5/06 (2013.01); G09B 5/065 (2013.01); G09B 5/08 (2013.01);
Abstract

A system for performing implicit assessment of a pupil is provided. The system receives a learning content from a content provider, the learning content having checkpoints at different stages of the learning content. The system associates assessment instructions with each checkpoint of the learning content. The system renders the received learning content for presentation to a pupil and captures the behaviors of the pupil during the presentation of the learning content. The system performs an assessment of the pupil at each checkpoint encountered during the rendering of the learning presentation. The assessment at a checkpoint includes using the checkpoint's associated assessment instructions to assign a score based on the captured behaviors. The system then produces an overall evaluation based on the assessments performed at the encountered checkpoints.


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Dey, Prasenjit. (2021). Computationally derived assessment in childhood education systems (U.S. Patent No. 10930169). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10930169

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