The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2021
Filed:
Nov. 11, 2019
Bentley Systems, Incorporated, Exton, PA (US);
Mathieu St-Pierre, Ste-Brigitte de Laval, CA;
Elenie Godzaridis, Quebec, CA;
Bentley Systems, Incorporated, Exton, PA (US);
Abstract
In an example embodiment, techniques are provided for displaying contour lines on a multi-resolution mesh substantially in real-time. Contour lines may be computed on a per-tile basis, scaling for various resolutions. The mesh and computed contour lines from lower resolution tiles may be displayed as temporary (referred to hereinafter as 'overview') data while the mesh and contour lines for higher resolution tiles are obtained or computed, to enable substantially real-time update. The techniques may handle very large meshes and large numbers of contour lines, without unduly taxing hardware resources. The techniques may also be applicable to multiple types of meshes (e.g., 2-D, 2.5-D, 3-D, 4-D, etc.).