The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Feb. 09, 2018
Applicant:

Cathx Ocean Limited, Naas, IE;

Inventors:

Adrian Boyle, Kildare, IE;

Michael Flynn, Kildare, IE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/521 (2017.01); G06T 7/33 (2017.01); G06T 7/73 (2017.01); G01C 11/02 (2006.01); H04N 5/225 (2006.01); H04N 5/247 (2006.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G01C 11/02 (2013.01); G06T 7/344 (2017.01); G06T 7/521 (2017.01); G06T 7/75 (2017.01); H04N 5/2256 (2013.01); H04N 5/247 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30244 (2013.01);
Abstract

Provided are a method and system for calibrating parameters of an imaging system comprising at least one imaging device and broad and structured light sources, the method comprising: the at least one imaging device sequentially capturing broad light source image data and structured light source image data of one or more scenes using the broad and structured light sources, respectively; generating a photogrammetric model of the broad light source image data and a photogrammetric model of the structured light source image data using respective coordinates of the broad and structured light source image data; determining corresponding features in the respective photogrammetric models; iteratively solving parameters of the imaging system to correct variations between corresponding features in the respective photogrammetric models, converge the models and obtain calibration parameters; and applying the calibration parameters to the imaging system to compensate for errors in the relative positions of the imaging device and structured light source.


Find Patent Forward Citations

Loading…