The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Jul. 28, 2017
Applicant:

Google Inc., Mountain View, CA (US);

Inventors:

Suk Hwan Lim, Mountain View, CA (US);

Huizhong Chen, Mountain View, CA (US);

David Chen, Mountain View, CA (US);

Hsin-I Liu, Sunnyvale, CA (US);

Assignee:

Google LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 1/20 (2006.01); H04N 9/04 (2006.01); H04N 1/00 (2006.01); H04N 5/232 (2006.01); H04N 5/235 (2006.01); H04N 9/64 (2006.01); H04N 5/243 (2006.01);
U.S. Cl.
CPC ...
G06T 1/20 (2013.01); H04N 1/00832 (2013.01); H04N 5/2353 (2013.01); H04N 5/23212 (2013.01); H04N 5/23218 (2018.08); H04N 5/232411 (2018.08); H04N 5/243 (2013.01); H04N 9/045 (2013.01); H04N 9/64 (2013.01);
Abstract

The present disclosure provides image capture devices and associated methods that feature intelligent use of hardware-generated statistics. An example image capture device can include an imaging hardware pipeline that generates frames of imagery. The imaging hardware pipeline can generate one or more hardware-generated statistics based at least in part on, for example, the raw image data captured by the image sensor or intermediate image data within the pipeline. The image capture device can analyze the hardware-generated statistics to determine one or more metrics for the raw image data or the image. The image capture device can determine a downstream operation of the image capture device relative to the image based at least in part on the metrics determined from the hardware generated statistics.


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