The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

May. 25, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Asaf Adi, Qiryat Ata, IL;

Lior Limonad, Nesher, IL;

Nir Mashkif, Ein Carmel, IL;

Segev E Wasserkrug, Haifa, IL;

Alexander Zadorojniy, Haifa, IL;

Sergey Zeltyn, Haifa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01);
Abstract

Embodiments of the present invention may provide the capability to detect complex events while providing improved detection and performance. In an embodiment of the present invention, a method for detecting an event may comprise receiving data representing measurement or detection of physical parameters, conditions, or actions, quantizing the received data and selecting a number of samples from the quantized data, generating a hidden Markov model representing events to be detected using initial model values based on ideal conditions, wherein a desired output is defined as a sequence of states, and wherein a number of states of the hidden Markov model is less than or equal to the number of samples of the quantized data, adjusting the quantized data and the initial model values to improve accuracy of the model, determining a state sequence of the hidden Markov model, and outputting an indication of a detected event.


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