The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Aug. 16, 2017
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Biplob Debnath, Princeton, NJ (US);

Hui Zhang, Princeton Junction, NJ (US);

Jianwu Xu, Lawrenceville, NJ (US);

Nipun Arora, Plainsboro, NJ (US);

Guofei Jiang, Princeton, NJ (US);

Bo Zong, Plainsboro, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06N 20/00 (2019.01); G06F 11/00 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06N 7/00 (2013.01); G06F 11/00 (2013.01); G06F 11/3452 (2013.01); G06F 11/3476 (2013.01); G06N 20/00 (2019.01);
Abstract

A computer-implemented method for automatically analyzing log contents received via a network and detecting content-level anomalies is presented. The computer-implemented method includes building a statistical model based on contents of a set of training logs and detecting, based on the set of training logs, content-level anomalies for a set of testing logs. The method further includes maintaining an index and metadata, generating attributes for fields, editing model capability to incorporate user domain knowledge, detecting anomalies using field attributes, and improving anomaly quality by using user feedback.


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