The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Jun. 08, 2020
Applicant:

Clinc, Inc., Ann Arbor, MI (US);

Inventors:

Stefan Larson, Ann Arbor, MI (US);

Anish Mahendran, Ann Arbor, MI (US);

Parker Hill, Ann Arbor, MI (US);

Jonathan K. Kummerfeld, Ann Arbor, MI (US);

Michael A. Laurenzano, Ann Arbor, MI (US);

Lingjia Tang, Ann Arbor, MI (US);

Jason Mars, Ann Arbor, MI (US);

Assignee:

Clinic, Inc., Ann Arbor, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

Systems and methods for automatically detecting annotation discrepancies in annotated training data samples and repairing the annotated training data samples for a machine learning-based automated dialogue system include evaluating a corpus of a plurality of distinct training data samples; identifying one or more of a slot span defect and a slot label defect of a target annotated slot span of a target training data sample of the corpus based on the evaluation; and automatically correcting one or more annotations of the target annotated slot span based on the identified one or more of the slot span defect and the slot label defect.


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