The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Mar. 05, 2019
Applicant:

Otoichi Nakata, Kanagawa, JP;

Inventor:

Otoichi Nakata, Kanagawa, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06T 7/30 (2017.01); H04N 9/31 (2006.01); G06T 7/33 (2017.01);
U.S. Cl.
CPC ...
G06K 9/4671 (2013.01); G06T 7/30 (2017.01); G06T 7/33 (2017.01); H04N 9/3185 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/30004 (2013.01);
Abstract

An image processing device extracts, for a target area that has sites having different flexibilities and where markers corresponding to the respective flexibilities are put on the sites, marking positions where the markers are put according to each type of the markers from each of a first image to be projected and being an image of the target area captured in advance and a second image being an image of the target area captured before projection of the first image; executes, based on the extracted marking positions according to each type of the markers, image processing to align the marking positions of the markers contained in the first image with the marking positions of the markers contained in the second image by a processing method corresponding to the types of the markers; and generates, based on the processed first image, a projection image to be projected onto the target area.


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