The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2021
Filed:
Jul. 20, 2018
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Kohichi Kamijoh, Tokyo, JP;
Tetsuya Nasukawa, Kanagawa-ken, JP;
Yohei Ikawa, Kanagawa-ken, JP;
Masaki Ono, Tokyo, JP;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/58 (2020.01); G06F 40/30 (2020.01); G06F 40/253 (2020.01); G06Q 30/02 (2012.01); G06F 40/51 (2020.01);
U.S. Cl.
CPC ...
G06F 40/58 (2020.01); G06F 40/253 (2020.01); G06F 40/30 (2020.01); G06F 40/51 (2020.01); G06Q 30/0254 (2013.01);
Abstract
Text analysis includes determining one or more global analysis parameters based on backtranslation of a first corpus between supported languages. A new text analysis model is determined for an unsupported language based on the one or more global analysis parameters and a text analysis model for a first supported language. An input text is analyzed in the unsupported language with the new text analysis model.