The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2021
Filed:
Apr. 28, 2017
Netapp, Inc., Sunnyvale, CA (US);
Guy Sirton, Delta, CA;
Oliver Erik Seiler, New Westminster, CA;
Robin Scott Mahony, Vancouver, CA;
Vladimir Radu Avram, Vancouver, CA;
NETAPP, INC., Sunnyvale, CA (US);
Abstract
To effectively implement ILM policies and account for unreliability in a geographically distributed large-scale storage system, 'scanners' and 'ILM rules appliers' can be deployed on nodes throughout the storage system for large scale ILM implementation. Each scanner is programmed to deterministically self-assign a region of object namespace and scan that region of object namespace. To “scan” a region, a scanner accesses metadata of each object that has an identifier within the scanner's region and inserts the object metadata into one of a set of queues for ILM evaluation. An ILM rules applier dequeues object metadata for evaluation against ILM rules and determines whether an ILM task is to be performed for ILM rule compliance.