The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Nov. 13, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

John Richard Paveza, Morgan Hill, CA (US);

Harry M Yudenfriend, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 13/24 (2006.01); G06F 9/48 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3485 (2013.01); G06F 11/3419 (2013.01); G06F 13/24 (2013.01); G06F 9/4825 (2013.01); G06F 11/0757 (2013.01);
Abstract

In one example implementation according to an embodiment described herein, a computer-implemented method includes detecting input/output (I/O) interrupts for executing I/O operations occurring over a period of time. The method further includes calculating an I/O interrupt delay time (IIDT) for each I/O interrupt occurring during the period of time. The method further includes binning the IIDT for each I/O interrupt occurring during the period of time into one of a plurality of bins based on a value of the IIDT, each of the plurality of bins storing a count of IIDT values within a defined range. The method further includes determining a highest IIDT value. The method further includes identifying a performance degradation based at least on one of the count of IIDT values of each of the plurality of bins or the highest IIDT value. The method further includes implementing a corrective action to mitigate the performance degradation.


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