The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2021
Filed:
Dec. 28, 2018
Applicant:
Fanuc Corporation, Yamanashi, JP;
Inventor:
Tomofumi Uwano, Yamanashi, JP;
Assignee:
FANUC CORPORATION, Yamanashi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/0484 (2013.01); G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
G06F 3/04847 (2013.01); G06T 11/203 (2013.01); G06T 11/206 (2013.01);
Abstract
An abnormality detection parameter adjustment display device adjusts a parameter for determination for detecting operation abnormality of a mechanical facility based on an input from a user, collects operation information on the mechanical facility, creates a dataset based on the operation information, determines whether or not the dataset indicates a normal operating state, based on the parameter, displays the dataset in a graph, and makes an adjustment for display in such a position that the relationship between the data of the graph and the parameter is visually ascertainable.