The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Jan. 28, 2019
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

William Paul Hovis, Sammamish, WA (US);

Garrett Douglas Blankenburg, Sammamish, WA (US);

Peter Anthony Atkinson, Sammamish, WA (US);

Robert James Ray, Snoqualmie, WA (US);

Andres Felipe Hernandez Mojica, Seattle, WA (US);

Samy Boshra-Riad, Bellevue, WA (US);

Erng-Sing Wee, Bellevue, WA (US);

Brian Keith Langendorf, Benicia, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 1/3296 (2019.01); G06F 11/24 (2006.01); G01R 31/30 (2006.01); G06F 1/3225 (2019.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 1/3296 (2013.01); G01R 31/3004 (2013.01); G06F 1/3225 (2013.01); G06F 11/0757 (2013.01); G06F 11/24 (2013.01); Y02D 10/00 (2018.01);
Abstract

Power reduction and voltage adjustment techniques for computing systems and processing devices are presented herein. In one example, a method includes executing a voltage characterization service for a processing device of a computing apparatus to determine at least one supply voltage for the processing device, the voltage characterization service comprising a functional test that exercises the processing device at iteratively adjusted voltages in context with associated system elements of the computing apparatus. During execution of the voltage characterization service, the method includes monitoring for operational failures of at least the processing device, and responsive to the operational failures, determining at least one resultant supply voltage.


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