The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Jan. 27, 2017
Applicant:

Essilor International, Charenton-le-Pont, FR;

Inventors:

Ronald Gauthier, Charenton-le-Pont, FR;

Stephane Gueu, Charenton-le-Pont, FR;

Benoit Cazal, Charenton-le-Pont, FR;

Isabelle Simon, Charenton-le-Pont, FR;

Assignee:

Essilor International, Charenton-le-Pont, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41875 (2013.01); G05B 2219/31205 (2013.01); G05B 2219/31206 (2013.01); G05B 2219/45157 (2013.01); Y02P 90/02 (2015.11);
Abstract

A method for monitoring an optical lens manufacturing process at a first lens manufacturing side, the method including: a manufacturing data collecting, during which sets of manufacturing data indicative of at least a manufacturing process parameter and/or a manufacturing device parameters and/or an operator parameter and/or an environment parameter at the first lens manufacturing side are collected; a manufacturing information generating, during which at least one manufacturing information indicative of at least a manufacturing process parameter and/or a manufacturing device parameters and/or an operator parameter and/or an environment parameter at a second lens manufacturing side is generated based on the collected manufacturing data.


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