The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2021
Filed:
Jun. 21, 2018
Honeywell International Inc., Morris Plains, NJ (US);
Bahador Rashidi, Edmonton, CA;
Meenakshi Sundaram Krishnaswamy, Edmonton, CA;
Qing Zhao, Edmonton, CA;
Honeywell International Inc., Charlotte, NC (US);
Abstract
An apparatus, method, and non-transitory machine-readable medium provide for improved feature extraction and fault detection in a non-stationary process through unsupervised machine learning. The apparatus includes a memory and a processor operably connected to the memory. The processor receives training data regarding a field device in an industrial process control and automation system; extracts a meaningful feature from the training data; performs an unsupervised classification to determine a health index for the meaningful feature; identifies a faulty condition of real-time data using the health index of the meaningful feature; and performs a rectifying operation in the industrial process control and automation system for correcting the faulty condition of the field device.