The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2021
Filed:
Jul. 15, 2015
Leica Microsystems (Schweiz) Ag, Heerbrugg, CH;
Leica Microsystems (Schweiz) AG, Heerbrugg, CH;
Abstract
A microscope () is described, having an autofocus system () for executing a focusing procedure, having a first image sensor (), arranged in a first outcoupled beam path (), for acquiring a first image (); and a second image sensor (), arranged in a second outcoupled beam path (), for acquiring a second image (). The autofocus system () is embodied to adjust a relative location of the focal plane () with respect to the object plane (), at a focus displacement speed, during the image acquisition time for acquisition of the first image () acquired by the first image sensor () and of the second image () acquired by the second image sensor (), the focus displacement speed being equal to the ratio of an increment to the image acquisition time, and the increment being larger than the depth of focus of the microscope ().