The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2021
Filed:
Jul. 15, 2015
Applicant:
Leica Microsystems (Schweiz) Ag, Heerbrugg, CH;
Inventors:
Assignee:
Leica Microsystems (Schweiz) AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 7/36 (2006.01); G02B 21/24 (2006.01); G02B 21/36 (2006.01); H04N 5/232 (2006.01); H04N 5/247 (2006.01);
U.S. Cl.
CPC ...
G02B 21/244 (2013.01); G02B 7/36 (2013.01); G02B 21/245 (2013.01); G02B 21/361 (2013.01); G02B 21/365 (2013.01); G02B 21/367 (2013.01); H04N 5/23212 (2013.01); H04N 5/232123 (2018.08); H04N 5/247 (2013.01);
Abstract
A microscope () is described, comprising an autofocus system () for executing a focusing procedure, having a first image sensor (), arranged in a first outcoupled beam path (), for acquiring a first image (); and a second image sensor (), arranged in a second outcoupled beam path (), for acquiring a second image (). The autofocus system () is embodied in such a way that the focusing procedure is executable on the basis of at least a first operating mode and a second operating mode.