The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Jul. 08, 2019
Applicant:

Agc Inc., Chiyoda-ku, JP;

Inventors:

Kensuke Fujii, Tokyo, JP;

Michinori Suehara, Tokyo, JP;

Kazunari Tohyama, Tokyo, JP;

Assignee:

AGC Inc., Chiyoda-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 17/06 (2006.01); G02B 1/115 (2015.01); C23C 14/08 (2006.01); C23C 14/18 (2006.01); G02B 1/18 (2015.01);
U.S. Cl.
CPC ...
G02B 1/115 (2013.01); C23C 14/08 (2013.01); C23C 14/18 (2013.01); G02B 1/18 (2015.01);
Abstract

A glass laminate includes a glass substrate including a first main surface and a second main surface, an antireflection layer on at least one of the first main surface and the second main surface, and an antifouling layer on the antireflection layer. The antireflection layer includes at least one low refractive index layer and at least one high refractive index layer, and the low refractive index layer and the high refractive index layer being alternately laminated. The antireflection layer includes an outermost layer farthest from the glass substrate and the outermost layer is the low refractive index layer including SiOas a main component. A distribution of fluorine concentration in a thickness direction of the outermost layer, measured by secondary ion mass spectrometry, has a peak.


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