The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Apr. 18, 2019
Applicant:

University of Connecticut, Farmington, CT (US);

Inventors:

Ali M. Bazzi, South Windsor, CT (US);

Yiqi Liu, Storrs, CT (US);

Bryan Davis, Nashua, NH (US);

Assignee:

University of Connecticut, Farmington, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/34 (2020.01); G01R 31/50 (2020.01); G01R 19/25 (2006.01);
U.S. Cl.
CPC ...
G01R 31/343 (2013.01); G01R 31/50 (2020.01); G01R 19/25 (2013.01); G01R 31/346 (2013.01);
Abstract

Systems and methods for fault detection and diagnosis in a machine. The method includes selecting fault characteristic frequencies of faults, implementing the fault characteristic frequencies as modulating signals, receiving a feedback signal from at least one sensor associated with a machine, applying active modulation using the modulating signals to the feedback signal to obtain modulated signals, and monitoring for a low-frequency fault indicative component from the modulated signals.


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