The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Aug. 18, 2017
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Hirotada Teranishi, Kyoto, JP;

Takahiro Sakai, Kyoto, JP;

Assignee:

Omron Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/28 (2006.01); H01R 13/24 (2006.01); H01R 33/76 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06738 (2013.01); G01R 1/06716 (2013.01); G01R 1/0735 (2013.01); G01R 1/07314 (2013.01); G01R 31/2886 (2013.01); H01R 13/24 (2013.01); H01R 33/76 (2013.01);
Abstract

A probe pin is provided with a plate-like movable pin including: a flexible part configured to extend and contract lengthwise; a first contact part and a second contact part each provided at an end of the flexible part lengthwise; and a conduction-path forming element overlapping the movable pin along the thickness thereof. The conduction-path forming element includes a first contact surface and a second contact surface at lengthwise ends configured to contact the first contact part and second contact part; the movable pin and the conduction-path forming element are arranged to allow the first contact part to remain in contact with the first contact surface and the second contact part to remain in contact with the second contact surface while allowing relative movement of the movable pin and the conduction-path forming element lengthwise.


Find Patent Forward Citations

Teranishi, Hirotada. (2021). Probe pin and inspection unit (U.S. Patent No. 10928420). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10928420

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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