The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2021
Filed:
Jan. 23, 2017
Applicant:
Buhler Sortex Ltd., London, GB;
Inventors:
Benedict Deefholts, London, GB;
Timothy Kelf, London, GB;
Assignee:
Buhler Sortex Ltd., London, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B07C 5/34 (2006.01); G01N 21/85 (2006.01); B07C 5/342 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01N 21/85 (2013.01); B07C 5/3425 (2013.01); G06T 7/0004 (2013.01); G01N 2201/068 (2013.01); G01N 2201/0618 (2013.01); G01N 2201/0634 (2013.01); G01N 2201/0636 (2013.01); G06T 2207/10016 (2013.01);
Abstract
An inspection apparatus for inspecting a flow of particulate material, comprising: a background reflector () adjacent which in use falls a flow of particulate material (F); and a lighting unit () for illuminating an elongate viewing field (VF) across the background reflector (), the viewing field (VF) having a first width (w); wherein the lighting unit () comprises a fixed, non-scanning light source (), and the light source () is formed of one or more light elements () which define a second width (w) which is shorter than the first width (w) of the viewing field (VF).