The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Apr. 27, 2017
Applicant:

Lg Chem, Ltd., Seoul, KR;

Inventors:

Su Youn Han, Daejeon, KR;

Byoung Hyoun Kim, Daejeon, KR;

Dong Hyun Kim, Daejeon, KR;

Hye Sung Cho, Daejeon, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 19/10 (2006.01); G01N 25/58 (2006.01); G01N 33/44 (2006.01); G01N 1/20 (2006.01); G01N 25/48 (2006.01);
U.S. Cl.
CPC ...
G01N 19/10 (2013.01); G01N 1/20 (2013.01); G01N 25/4826 (2013.01); G01N 25/58 (2013.01); G01N 33/442 (2013.01);
Abstract

The present invention relates to an apparatus for measuring moisture of a solid sample, a method for measuring a moisture content of the solid sample, and a method for analyzing an imidization rate, and more particularly, to an apparatus for measuring moisture of a solid sample, a method for measuring a moisture content of the solid sample, and a method for analyzing an imidization rate, which detect the moisture content of the solid sample at a specific temperature by using a Karl-Fischer device capable of selectively detecting only the moisture content of the solid sample in the method for analyzing an imidization rate of the solid sample and calculate the imidization rate of the solid sample by using the detected moisture content.


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