The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2021
Filed:
May. 11, 2017
Illinois Tool Works Inc., Glenview, IL (US);
Roy Allen, North Andover, MA (US);
Stephen M. Mcmahon, Quincy, MA (US);
Roy Allen, North Andover, MA (US);
Stephen M. McMahon, Quincy, MA (US);
ILLINOIS TOOL WORKS INC., Glenview, IL (US);
Abstract
This disclosure relates to methods and tools for calibrating a camera-based three-dimensional optical metrology system such as that used for non-contact measurement of strain in a materials test system. A tool is provided which holds a calibration plate within a test space of a load frame of a materials testing device. The tool includes a spindle which rotates around a rotational axis to a series of detent rotational positions. The spindle engages the calibration plate by a bearing configuration which allows the tilt angle of the calibration plate to be varied. The rotation of the spindle and the variation of the tilt angle provides for two degrees of freedom of movement within the test space. The resulting sequence of calibration plate positions is systematic and repeatable.