The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Oct. 26, 2017
Applicant:

Nat'l Inst. of Adv. Industrial Sci. and Tech., Tokyo, JP;

Inventor:

Hideyuki Tanaka, Nagareyama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 11/25 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G01B 11/254 (2013.01); G06T 7/74 (2017.01); G06T 2207/30204 (2013.01);
Abstract

A marker for achieving more accurate position and posture estimation, and a posture estimation method and a position and posture estimation method using this marker are provided. In order to solve this problem, the present invention provides a marker for estimating the posture of an object, wherein the marker includes standard variable moire patterns VSand VSfor estimating a visual line angle around at least one axis with respect to the object and high-sensitivity variable moire patterns VHand VHthat have a resolution of visual line angle higher than the standard variable moire patterns VSand VSand that are used to estimate the visual line angle around the axis.


Find Patent Forward Citations

Tanaka, Hideyuki. (2021). Marker, and posture estimation method and position and posture estimation method using marker (U.S. Patent No. 10928191). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10928191

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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