The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Feb. 20, 2020
Applicant:

Inkbit, Llc, Medford, MA (US);

Inventors:

Wojciech Matusik, Lexington, MA (US);

Aaron Weber, Arlington, MA (US);

Desai Chen, Arlington, MA (US);

Assignee:

Inkbit, LLC, Medford, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/386 (2017.01); B33Y 10/00 (2015.01); B29C 64/393 (2017.01); B33Y 50/00 (2015.01); B33Y 30/00 (2015.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
B29C 64/386 (2017.08); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 50/00 (2014.12); B33Y 30/00 (2014.12); G01N 21/8422 (2013.01); G01N 2021/8427 (2013.01); G01N 2021/8438 (2013.01); G01N 2201/10 (2013.01);
Abstract

A scanning approach used in the feedback procedure is able to distinguish between different materials, for example, based on spectral properties (e.g., color) of reflectance from a partially fabricated object. Because material layers can be quite thin, and in general the materials are not completely opaque, properties of subsurface layers can greatly affect the reflectance of a thin layer of one material over a thicker section of another material. Detection of locations of thin layers after a material change takes into account the reflectance characteristics of the object before the thin layer was deposited.


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