The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2021
Filed:
Oct. 24, 2011
Raymond Chan, San Diego, CA (US);
Jinnan Wang, Seattle, WA (US);
Adrien Emmanuel Desjardins, Waterloo, CA;
Luis Felipe Gutierrez, Jersey City, NJ (US);
Maya Ella Barley, Walton on Thames, GB;
Gert Wim 't Hooft, Eindhoven, NL;
Raymond Chan, San Diego, CA (US);
Jinnan Wang, Seattle, WA (US);
Adrien Emmanuel Desjardins, Waterloo, CA;
Luis Felipe Gutierrez, Jersey City, NJ (US);
Maya Ella Barley, Walton on Thames, GB;
Gert Wim 'T Hooft, Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
A system and method for adaptive imaging include a shape sensing system () coupled to an interventional device () to measure spatial characteristics of the interventional device in a subject. An image module () is configured to receive the spatial characteristics and generate one or more control signals in accordance with the spatial characteristics. An imaging device () is configured to image the subject in accordance with the control signals.