The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Feb. 04, 2019
Fujitsu Limited, Kawasaki, JP;
Ai Yano, Kawasaki, JP;
Takeshi Ohtani, Kawasaki, JP;
Ryuichi Matsukura, Kawasaki, JP;
Jun Kakuta, Yokohama, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
Provided is an abnormality detecting method implemented by a computer, the abnormality detecting method including: acquiring a plurality of pieces of performance information each containing performance of a management target device; determining whether abnormal performance information is included among the plurality of pieces of performance information, in accordance with a condition for determining an abnormality of the performance; when the abnormal performance information is included, identifying a type of a failure corresponding to the abnormal performance information, in accordance with a correspondence relationship that associates respective combinations of a plurality of identifiers indicating the abnormality of the performance with failure types; and deciding a degree of importance of a measure against the failure, in accordance with information related to the identified failure type.