The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Oct. 31, 2018
Applicant:

Arcsoft Corporation Limited, Hangzhou, CN;

Inventors:

Li Yu, Shanghai, CN;

Menghan Liu, Shanghai, CN;

Wang Miao, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 17/00 (2006.01); H04N 5/33 (2006.01); H04N 5/341 (2011.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); H04N 5/33 (2013.01); H04N 5/3415 (2013.01);
Abstract

The present invention provides a method and a device for calibration applied to the field of image processing. The method includes: acquiring a common two-dimensional image and an infrared image of a calibration object, wherein the calibration object carries a first pattern; calculating coordinates of the first pattern in the common two-dimensional image, acquiring coordinates of the first pattern in a global coordinate system, and calculating intrinsic parameters of a first camera device capturing the common two-dimensional image; and calculating coordinates of the first pattern in the infrared image, acquiring the coordinates of the first pattern in the global coordinate system, and calculating intrinsic parameters of a second camera device capturing the infrared image. The method for calibration is capable of enhancing calibration efficiency by a simple calibration method when calibrating a depth camera device.


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