The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Aug. 04, 2017
Applicant:

Epilog Imaging Systems, San Diego, CA (US);

Inventor:

Michael Mojaver, Poway, CA (US);

Assignee:

Epilog Imaging Systems, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); H04N 5/225 (2006.01); G06T 7/207 (2017.01); G06T 7/215 (2017.01);
U.S. Cl.
CPC ...
H04N 5/23238 (2013.01); G06T 7/207 (2017.01); G06T 7/215 (2017.01); H04N 5/2253 (2013.01); H04N 5/2254 (2013.01); H04N 5/2258 (2013.01); H04N 5/232 (2013.01); H04N 5/23229 (2013.01);
Abstract

An imaging system for obtaining images having enhanced features is described. The imaging system includes an optical system that receives and direct light from a field of view to two or more image planes. The image planes are optically coupled and configured to detect at least a portion of the received light and generate image data corresponding to the field of view. The system can include a processor that receives the image data generated by each plane and combines the data to form a combined image. The combined image can have a higher resolution than any image that can be obtained from the individual image sensors and the image plane may be curved to reduce the cost of optics. The processor can detect objects (e.g., moving objects) contained in images obtained from one image plane and configure the other image planes to obtain more detailed images of the detected objects.


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