The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Nov. 29, 2018
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Ishan Chatterjee, Mountain View, CA (US);

Christian Holz, Seattle, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); G02B 27/28 (2006.01); H04N 1/00 (2006.01); G02B 13/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2254 (2013.01); G02B 13/001 (2013.01); G02B 27/288 (2013.01); H04N 1/00129 (2013.01); H04N 5/2258 (2013.01); H04N 2201/0084 (2013.01);
Abstract

An imaging system comprises one or more optical sensor arrays with separate first and second sensor elements, an objective lens system, a polarization filter system, and associated logic. The objective lens system is configured to direct light received at a given angle onto the first sensor element and onto the second sensor element. The polarization filter system includes a first polarizer portion positioned to filter the light en route to the first sensor element and a second polarizer portion positioned to filter the light en route to the second sensor element, the first and second polarizer portions providing unequal relative attenuance of nonparallel polarization components of the light received at the given angle. The logic is configured to compare intensity of the light directed onto the first sensor element relative to the light directed onto the second sensor element.


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